• DocumentCode
    997904
  • Title

    A novel method to compensate for the effect of light shift in a rubidium atomic clock pumped by a semiconductor laser

  • Author

    Hashimot, Minoru ; Ohtsu, Motoichi

  • Author_Institution
    Tokyo Inst. of Technol., Yokohama, Japan
  • Volume
    39
  • Issue
    3
  • fYear
    1990
  • fDate
    6/1/1990 12:00:00 AM
  • Firstpage
    458
  • Lastpage
    462
  • Abstract
    Precise measurement of the shift (i.e. microwave frequency shift induced by the electric field of the pumping light) in a rubidium atomic clock pumped by a semiconductor laser is discussed. The spectral lineshape of the microwave resonance, which is used as a frequency discriminator for the atomic clock in the optical microwave double resonance experiment, depends strongly on the spatial distribution of the laser beam intensity, laser frequency detuning, and modulation parameters of the microwave frequency. Based on measurements of the deformation of the resonance lineshape, a self-tuning system was built to compensate for the effect of light shift. As a result of controlling the laser frequency with this system, long-term drift of the microwave frequency as low as 6.3×10-13/h was obtained
  • Keywords
    atomic clocks; laser beam applications; laser frequency stability; microwave spectra of atoms; optical pumping; rubidium; semiconductor junction lasers; spectral line shift; 87Rb; atomic clock; deformation; electric field; frequency discriminator; laser beam intensity; laser frequency detuning; light shift; long-term drift; microwave frequency shift; microwave resonance; modulation parameters; optical microwave double resonance experiment; pumping light; self-tuning; semiconductor laser; spatial distribution; spectral lineshape; Atom lasers; Atomic clocks; Atomic measurements; Laser excitation; Masers; Microwave frequencies; Optical modulation; Pump lasers; Resonance; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.106272
  • Filename
    106272