DocumentCode
998305
Title
D&T Research
Volume
2
Issue
3
fYear
1985
fDate
6/1/1985 12:00:00 AM
Firstpage
87
Lastpage
100
Keywords
CADCAM; Circuit testing; Circuits and systems; Computer aided manufacturing; Computer integrated manufacturing; Design automation; Integrated circuit manufacture; Semiconductor device manufacture; Telecommunication computing; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1985.294767
Filename
4069594
Link To Document