• DocumentCode
    998402
  • Title

    Reliability of CMOS Integrated Circuits

  • Author

    Schnable, G.L. ; Gallace, L.J. ; Pujol, H.L.

  • Author_Institution
    RCA Laboratories
  • Volume
    11
  • Issue
    10
  • fYear
    1978
  • Firstpage
    6
  • Lastpage
    17
  • Abstract
    CMOS ICsare being produced using a variety of processes, and considerable data is now available on their reliability and failure mechanisms.
  • Keywords
    CMOS digital integrated circuits; CMOS integrated circuits; CMOS technology; Digital integrated circuits; Integrated circuit reliability; Integrated circuit technology; MOS devices; Packaging; Substrates; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/C-M.1978.217937
  • Filename
    1646712
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=998402