In situ OTDR for low-cost optical networks using singlemode 850 nm VCSEL

Author

Keeler, G.A. ; Serkland, D.K. ; Geib, K.M. ; Peake, G.M.

Author_Institution

Compound Semicond. Res. Lab., Albuquerque, NM, USA

Volume

41

Issue

14

fYear

2005

fDate

7/7/2005 12:00:00 AM

Firstpage

819

Lastpage

820

Abstract

A new approach to optical time-domain reflectometry (OTDR) is proposed that will enable distributed fault monitoring in singlemode VCSEL-based networks. In situ OTDR uses the transmitter VCSEL already resident in data transceivers as both emitter and resonant-cavity photodiode for fault location measurements. Also valuable at longer wavelengths, the concept is demonstrated here using an 850 nm oxide-confined VCSEL and simple electronics. The dead times and sensitivity obtained are adequate to detect the majority of faults anticipated in local- and metropolitan-area networks.

Keywords

fault location; optical fibre networks; optical fibre testing; optical time-domain reflectometry; surface emitting lasers; 850 nm; data transceivers; dead times; distributed fault monitoring; emitter; fault location measurements; in situ OTDR; local area networks; low-cost optical networks; metropolitan area networks; optical time domain reflectometry; resonant cavity photodiode; sensitivity; single mode VCSEL;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:20051503

Filename

1468057