DocumentCode :
998436
Title :
Predetermination of the A-C. Characteristics of Dielectrics
Author :
Whitehead, J.B. ; Baños, Alfredo, Jr.
Author_Institution :
Dean, School of Engg., Johns Hopkins University.
Volume :
51
Issue :
2
fYear :
1932
fDate :
6/1/1932 12:00:00 AM
Firstpage :
392
Lastpage :
402
Abstract :
From the charge and discharge currents of any type of dielectric under continuous potential it is possible to predict accurately the loss, power factor and capacity at 60 cycles. This is done by an empirical determination of the equation for the relaxation function of the dielectric at a given temperature, followed by the application of von Schweidler´s method. The method developed is available at any frequency, provided that the continuous potential charge and discharge currents may be measured over initial time intervals comparable with the alternating period. It is shown that agreement of the relaxation function with the t-nexpression is not general, but on the contrary, it is confined to dielectrics showing negligible or no irreversible conduction. The inadequacy of the t-n expression is proved on experimental and analytical reasons. Chief among them is the failure of the t-n expression to predict accurately the variation of dielectric loss with frequency. A convenient and sufficient expression for the relaxation function is shown to be a sum of three exponentials. Further, experiment and analysis prove that the method of three exponentials predicts accurately the a-c. behavior of a dielectric at 60 cycles. The usual forms of irreversible conduction encountered are defined and classified. The case where the initial constant current does not obey Ohm´s law has been considered analytically in its contribution to the a-c. behavior. The manner in which the complete a-c. behavior of a dielectric is accurately predicted from suitable d-c.
Keywords :
Absorption; Charge measurement; Current measurement; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Time measurement;
fLanguage :
English
Journal_Title :
American Institute of Electrical Engineers, Transactions of the
Publisher :
ieee
ISSN :
0096-3860
Type :
jour
DOI :
10.1109/T-AIEE.1932.5056082
Filename :
5056082
Link To Document :
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