Title :
A fast mode analysis for waveguides of arbitrary cross section with multiple regions by using a spectrum of two-dimensional solutions and asymptotic waveform evaluation
Author :
Yang, Jian ; Carlberg, Ulf ; Kildal, Per-Simon ; Kehn, Malcolm Ng Mou
Author_Institution :
Dept. of Electromagn., Chalmers Univ. of Technol., Goteborg, Sweden
fDate :
6/1/2004 12:00:00 AM
Abstract :
A fast mode analysis for waveguides of arbitrary cross section with multiple regions is presented in this paper. The analysis is based on a spectrum of two-dimensional (2-D) solutions with application of asymptotic waveform evaluation, which requires only several 2-D solutions in searching for the propagation modes and calculating the field distribution of the modes in waveguides. The boundaries of waveguides can be modeled by perfect electric conductors, perfect magnetic conductors, dielectric materials, and asymptotic strip boundary conditions. By this modeling, one can also analyze the waveguides with the soft and hard surfaces. The method is excitation dependent, which provides a tool to analyze the response of different modes to different excitations. No existence of spurious modes is experienced by using this method. The verification and comparison of the numerical results with analytical, published data, and measurements are also presented in this paper.
Keywords :
circular waveguides; conductors (electric); dielectric materials; rectangular waveguides; waveform analysis; waveguide theory; 2D solutions; asymptotic waveform evaluation; dielectric materials; electric conductors; fast mode analysis; magnetic conductors; two-dimensional solutions; waveguides; Conducting materials; Cutoff frequency; Electromagnetic waveguides; Equations; Magnetic analysis; Moment methods; Propagation constant; Surface waves; Transmission line matrix methods; Two dimensional displays; AWE; Asymptotic waveform evaluation; MoM; S2DS; method of moments; propagation modes; spectrum of two-dimensional solutions; waveguides;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.828464