DocumentCode :
998653
Title :
MIND: An inside Look at an Expert System for Electronic Diagnosis
Author :
Wilkinson, A.Jesse
Author_Institution :
Teradyne Inc.
Volume :
2
Issue :
4
fYear :
1985
Firstpage :
69
Lastpage :
77
Abstract :
Because of its intended purpose, it is very complicated to diagnose faults in VLSI test system hardware. When this problem is considered in the hardware design phase, it is apparent that VLSI test systems need to have built-in self-test features. For a self-test to be of any value, the circuit check program should minimize the hardware involved in each test. MIND is an expert system for VLSI test system diagnosis that integrates the principles of their hierarchical design and experts´ heuristics to achieve a practical approach to reducing test system downtime.
Keywords :
Artificial intelligence; Automatic testing; Circuit faults; Circuit testing; Diagnostic expert systems; Fault diagnosis; Hardware; Machine intelligence; System testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1985.294748
Filename :
4069630
Link To Document :
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