DocumentCode
998653
Title
MIND: An inside Look at an Expert System for Electronic Diagnosis
Author
Wilkinson, A.Jesse
Author_Institution
Teradyne Inc.
Volume
2
Issue
4
fYear
1985
Firstpage
69
Lastpage
77
Abstract
Because of its intended purpose, it is very complicated to diagnose faults in VLSI test system hardware. When this problem is considered in the hardware design phase, it is apparent that VLSI test systems need to have built-in self-test features. For a self-test to be of any value, the circuit check program should minimize the hardware involved in each test. MIND is an expert system for VLSI test system diagnosis that integrates the principles of their hierarchical design and experts´ heuristics to achieve a practical approach to reducing test system downtime.
Keywords
Artificial intelligence; Automatic testing; Circuit faults; Circuit testing; Diagnostic expert systems; Fault diagnosis; Hardware; Machine intelligence; System testing; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1985.294748
Filename
4069630
Link To Document