• DocumentCode
    998653
  • Title

    MIND: An inside Look at an Expert System for Electronic Diagnosis

  • Author

    Wilkinson, A.Jesse

  • Author_Institution
    Teradyne Inc.
  • Volume
    2
  • Issue
    4
  • fYear
    1985
  • Firstpage
    69
  • Lastpage
    77
  • Abstract
    Because of its intended purpose, it is very complicated to diagnose faults in VLSI test system hardware. When this problem is considered in the hardware design phase, it is apparent that VLSI test systems need to have built-in self-test features. For a self-test to be of any value, the circuit check program should minimize the hardware involved in each test. MIND is an expert system for VLSI test system diagnosis that integrates the principles of their hierarchical design and experts´ heuristics to achieve a practical approach to reducing test system downtime.
  • Keywords
    Artificial intelligence; Automatic testing; Circuit faults; Circuit testing; Diagnostic expert systems; Fault diagnosis; Hardware; Machine intelligence; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1985.294748
  • Filename
    4069630