• DocumentCode
    998727
  • Title

    Coherence optimization using the polarization state conformation in PolInSAR

  • Author

    Qong, Muhtar

  • Author_Institution
    Dept. of Remote Sensing, Kyushu Tokai Univ., Kumamoto, Japan
  • Volume
    2
  • Issue
    3
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    301
  • Lastpage
    305
  • Abstract
    A new coherence optimization algorithm is proposed for polarimetric synthetic aperture radar (SAR) interferometry applications by using the polarization state conformation algorithm based on the polarimetric basis transformation along with the polarization signatures. Through application of this algorithm, the resemblance between the scattering mechanisms of the same target in the repeat-pass polarimetric SAR (POLSAR) images is maximized. Then, coherence maps between the repeat-pass POLSAR images, before and after application of the algorithm, are generated. The coherences obtained by this method represent the best coherences or optimized coherences between the POLSAR images. The effects predicted by the theory are confirmed by the POLSAR data acquired by the Jet Propulsion Laboratory Spaceborne Imaging Radar mission.
  • Keywords
    coherence; optimisation; radar polarimetry; radiowave interferometry; spaceborne radar; synthetic aperture radar; Jet Propulsion Laboratory Spaceborne Imaging Radar mission; PolInSAR; coherence optimization algorithm; polarimetric basis transformation; polarimetric synthetic aperture radar interferometry applications; polarization signatures; polarization state conformation algorithm; repeat-pass POLSAR images; scattering mechanisms; Airborne radar; Interferometry; Laboratories; Optimization methods; Polarimetric synthetic aperture radar; Polarization; Propulsion; Radar scattering; Spaceborne radar; Synthetic aperture radar; Coherence optimization; polarization signature; polarization state; radar polarimetry;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2005.847754
  • Filename
    1468086