Method for the direct measurement of y-, z-, h- and g-parameters at microwave frequencies

A new measurement technique is presented that uses a modification of standard S-parameter instrumentation to directly measure y-,z-,h- andg-parameters at microwave frequencies. The required open-circuit and short-circuit terminations are created by the appropriate simultaneous application of the test r.f. signal to both ports of the device under test. Experimental results indicate the possibility of using this approach to improve the accuracy of 2-port characterisations at microwave frequencies.