• DocumentCode
    998771
  • Title

    A band selection technique for spectral classification

  • Author

    De Backer, Steve ; Kempeneers, Pieter ; Debruyn, Walter ; Scheunders, Paul

  • Author_Institution
    Visionlab, Univ. of Antwerp, Belgium
  • Volume
    2
  • Issue
    3
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    319
  • Lastpage
    323
  • Abstract
    In hyperspectral remote sensing, sensors acquire reflectance values at many different wavelength bands, to cover a complete spectral interval. These measurements are strongly correlated, and no new information might be added when increasing the spectral resolution. Moreover, the higher number of spectral bands increases the complexity of a classification task. Therefore, feature reduction is a crucial step. An alternative would be to choose the required sensor bands settings a priori. In this letter, we introduce a statistical procedure to provide band settings for a specific classification task. The proposed procedure selects wavelength band settings which optimize the separation between the different spectral classes. The method is applicable as a band reduction technique, but it can as well serve the purpose of data interpretation or be an aid in sensor design. Results on a vegetation classification task show an improvement in classification performance over feature selection and other band selection techniques.
  • Keywords
    image classification; vegetation mapping; band reduction technique; band selection technique; data interpretation; feature reduction; hyperspectral remote sensing; reflectance; sensor design; spectral classification; spectral resolution; statistical procedure; vegetation classification; Continuous wavelet transforms; Feature extraction; Hyperspectral imaging; Hyperspectral sensors; Optical sensors; Pattern classification; Reflectivity; Remote sensing; Vegetation; Wavelength measurement; Feature reduction; hyperspectral data; pattern classification;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2005.848511
  • Filename
    1468090