Title :
Comments on "High resolution electron microscope study of Sm(Co, Fe, Cu, Zr)7.5magnets"
Author :
Rabenberg, L. ; Mishra, Ravishankar ; Thomas, Gael
Author_Institution :
University of Texas at Austin, TX
fDate :
11/1/1983 12:00:00 AM
Keywords :
Diffraction; Electron microscopy; Iron; Lattices; Magnetic force microscopy; Magnets; Materials science and technology; Optical reflection; Scattering; Zirconium;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1983.1062800
