• DocumentCode
    999113
  • Title

    Examination of grain boundaries in polycrystalline solar cells using a scanning optical microscope

  • Author

    Gannaway, J.N. ; Wilson, Thomas

  • Author_Institution
    University of Oxford, Department of Engineering Science, Oxford, UK
  • Volume
    14
  • Issue
    16
  • fYear
    1978
  • Firstpage
    507
  • Lastpage
    508
  • Abstract
    A scanning optical microscope in which the object is scanned mechanically is used to produce images from polycrystalline solar cells using both the reflected-light and photoinduced current modes.
  • Keywords
    grain boundaries; laser beam applications; optical microscopy; photoconductivity; semiconductor device testing; solar cells; grain boundaries examination; photoinduced current modes; polycrystalline solar cells; reflected light images; scanning optical microscope;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19780340
  • Filename
    4249501
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=999113