• DocumentCode
    999162
  • Title

    Tungsten/gold gate GaAs microwave f.e.t.

  • Author

    Morkoc, H. ; Andrews, Jeffrey ; Sankaran, Ravi ; Dully, J.H.

  • Author_Institution
    Varian Associates Inc., Corporate Solid-State Laboratory, Palo Alto, USA
  • Volume
    14
  • Issue
    16
  • fYear
    1978
  • Firstpage
    514
  • Lastpage
    515
  • Abstract
    Preliminary results on the performance of a W/Au gate GaAs f.e.t. having T-type gate cross-section are reported. The Au overhang on the W gate can be used to self-align the source and the drain with respect to the gate, which can be used to achieve submicrometre gate dimensions rather easily. An f.e.t. with 0.7 ¿m gate length and 140 ¿m gate periphery exhibited a measured maximum available gain (m.a.g.) of 14 dB at 8 GHz, Experiments on the W Schottky diodes indicate that the leakage current, instead of degrading, is actually reduced by annealing at high temperature in a H2 atmosphere for 10 min.
  • Keywords
    Schottky gate field effect transistors; gallium arsenide; semiconductor technology; solid-state microwave devices; tungsten; GaAs microwave MESFET; T gate cross section; W/Au gate; self aligning source and drain; submicron gate length;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19780345
  • Filename
    4249506