DocumentCode
999162
Title
Tungsten/gold gate GaAs microwave f.e.t.
Author
Morkoc, H. ; Andrews, Jeffrey ; Sankaran, Ravi ; Dully, J.H.
Author_Institution
Varian Associates Inc., Corporate Solid-State Laboratory, Palo Alto, USA
Volume
14
Issue
16
fYear
1978
Firstpage
514
Lastpage
515
Abstract
Preliminary results on the performance of a W/Au gate GaAs f.e.t. having T-type gate cross-section are reported. The Au overhang on the W gate can be used to self-align the source and the drain with respect to the gate, which can be used to achieve submicrometre gate dimensions rather easily. An f.e.t. with 0.7 ¿m gate length and 140 ¿m gate periphery exhibited a measured maximum available gain (m.a.g.) of 14 dB at 8 GHz, Experiments on the W Schottky diodes indicate that the leakage current, instead of degrading, is actually reduced by annealing at high temperature in a H2 atmosphere for 10 min.
Keywords
Schottky gate field effect transistors; gallium arsenide; semiconductor technology; solid-state microwave devices; tungsten; GaAs microwave MESFET; T gate cross section; W/Au gate; self aligning source and drain; submicron gate length;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19780345
Filename
4249506
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