• DocumentCode
    999325
  • Title

    A Symmetric Electromagnetic-Circuit Simulator Based on the Extended Time-Domain Finite Element Method

  • Author

    Wang, Rui ; Jin, Jian-Ming

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL
  • Volume
    56
  • Issue
    12
  • fYear
    2008
  • Firstpage
    2875
  • Lastpage
    2884
  • Abstract
    A symmetric hybrid electromagnetic-circuit simulator based on the extended time-domain finite element method (FEM) is presented for the simulation of microwave devices embedded with linear/nonlinear lumped circuits. The distributive portion of the device is modeled by the time-domain FEM to generate an electromagnetic subsystem, while the embedded lumped circuits are analyzed by a SPICE-like transient circuit solver to generate a circuit subsystem. A symmetric global system for both the electromagnetic and circuit unknowns is then established by combining the two fully discretized subsystems through coupling matrices to model their interactions. For active devices, the resulting global electromagnetic-circuit system usually includes nonlinear equations, and thus is solved by a solution algorithm carefully designed to handle nonlinearity. The proposed simulator significantly extends the capability of the existing time-domain finite element solver to model more complex and active devices such as microwave amplifiers. Numerical examples are presented to validate the algorithm and demonstrate its accuracy and applications.
  • Keywords
    SPICE; circuit simulation; electromagnetic devices; finite element analysis; lumped parameter networks; time-domain analysis; SPICE-like transient circuit; extended time-domain finite element method; linear lumped circuits; nonlinear lumped circuits; symmetric electromagnetic-circuit simulator; Hybrid solver; linear/nonlinear circuit simulation; time-domain finite element method (FEM); transient analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2008.2007336
  • Filename
    4682636