• DocumentCode
    999377
  • Title

    Comparison of optical waveguide losses in silicon-on-insulator

  • Author

    Zinke, T. ; Fischer, Ulrich ; Splett, A. ; Schuppert, B. ; Petermann, K.

  • Author_Institution
    Inst. fur Hochfrequenztech., Tech. Univ. Berlin, Germany
  • Volume
    29
  • Issue
    23
  • fYear
    1993
  • Firstpage
    2031
  • Lastpage
    2033
  • Abstract
    Waveguide losses in SOI (silicon-on-insulator) material fabricated by different techniques are compared thus enabling one to confirm the theoretical dependence of losses on layer thickness. Single-mode waveguide losses in BE-SOI (bond and etchback-SOI) below 0.5dB/cm are reported for waveguides with cross-sections of several square micrometres.
  • Keywords
    elemental semiconductors; integrated optics; optical losses; optical waveguides; semiconductor-insulator boundaries; silicon; silicon compounds; Si-SiO 2; Si-SiO 2 structure; bond and etchback-SOI; integrated optics; layer thickness; optical waveguide losses; rib waveguides; silicon-on-insulator; single-mode waveguide losses; waveguides cross-sections;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19931356
  • Filename
    253960