Title :
Decomposed SCOPF for Improving Efficiency
Author :
Li, Yuan ; McCalley, J.D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA
Abstract :
This letter describes an approach using Benders decomposition to decompose security-constrained optimal power flow (DSCOPF). It provides a complexity analysis to give insight into the improved computing speeds obtained using the approach. The method is illustrated on two six-bus test systems and on the IEEE reliability test system.
Keywords :
load flow; power system security; Benders decomposition; DSCOPF; IEEE reliability test system; decompose security-constrained optimal power flow; six-bus test systems; Benders decomposition; parallel computing; security-constrained optimal power flow;
Journal_Title :
Power Systems, IEEE Transactions on
DOI :
10.1109/TPWRS.2008.2002166