Title :
ATLAS TileCal Read-Out Driver System Production and Initial Performance Results
Author :
Poveda, Jorge ; Abdallah, J. ; Castillo, V. ; Cuenca, C. ; Ferrer, A. ; Fullana, E. ; Gonzalez, V. ; Higon, E. ; Ruiz-Martinez, A. ; Salvachua, B. ; Sanchis, E. ; Solans, C. ; Torres, J. ; Valero, A. ; Valls, J.A.
Author_Institution :
CSlC-Univ. de Valencia, Valencia
Abstract :
The ATLAS hadronic Tile Calorimeter detector (TileCal) is an iron-scintillating tiles sampling calorimeter designed to operate at the Large Hadron Collider accelerator at CERN. The central element of the back-end system of the TileCal detector is a 9U VME read-out driver (ROD) board. The operation of the TileCal calorimeter requires a total of 32 ROD boards. This paper summarizes the tests performed during the ROD production and the results obtained. Data processing is performed in the ROD by digital signal processors, whose operation is based on the use of online algorithms such as the optimal filtering algorithm for the signal amplitude, pedestal and time reconstruction and the online Muon tagging algorithm which identifies low transverse momentum muons. The initial performance of both algorithms run during commissioning is also presented in this paper.
Keywords :
high energy physics instrumentation computing; muon detection; nuclear electronics; particle calorimetry; position sensitive particle detectors; readout electronics; signal processing; solid scintillation detectors; ATLAS hadronic Tile Calorimeter detector; CERN; Large Hadron Collider accelerator; ROD; TileCal detector; data processing; digital signal processors; iron-scintillating tiles; muon tagging algorithm; optimal filtering algorithm; read-out driver system; signal amplitude; time reconstruction; transverse momentum muons; Detectors; Filtering algorithms; Large Hadron Collider; Mesons; Performance evaluation; Production systems; Sampling methods; Signal processing algorithms; Testing; Data acquisition; data processing; electronic equipment testing; field programmable gate arrays; integrated circuit;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2007.908108
