DocumentCode
999930
Title
VHDL´s Impact on Test
Author
Lowenstein, Al ; Winter, Greg
Author_Institution
Prospective Computer Analysts
Volume
3
Issue
2
fYear
1986
fDate
4/1/1986 12:00:00 AM
Firstpage
48
Lastpage
53
Abstract
High-tech microcircuits command a modernized approach to design and test. This approach, born of harsh economic reality, mandates that effective test be inextricably tied to design. The test generation problem is enormous and requires automatic test program generators that in turn require computer-readable descriptions of the unit under test. The government-sponsored VHSIC Hardware Description Language, or VHDL, addresses both design and test needs, allowing both efforts to work together to reduce product cost while improving product quality. In this article, we focus on the needs of test throughout a product´s life cycle and explain how VHDL serves those needs.
Keywords
Automatic control; Automatic test equipment; Automatic testing; Computational modeling; Costs; Hardware design languages; Life testing; Packaging; Production; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1986.294903
Filename
4069761
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