• DocumentCode
    999930
  • Title

    VHDL´s Impact on Test

  • Author

    Lowenstein, Al ; Winter, Greg

  • Author_Institution
    Prospective Computer Analysts
  • Volume
    3
  • Issue
    2
  • fYear
    1986
  • fDate
    4/1/1986 12:00:00 AM
  • Firstpage
    48
  • Lastpage
    53
  • Abstract
    High-tech microcircuits command a modernized approach to design and test. This approach, born of harsh economic reality, mandates that effective test be inextricably tied to design. The test generation problem is enormous and requires automatic test program generators that in turn require computer-readable descriptions of the unit under test. The government-sponsored VHSIC Hardware Description Language, or VHDL, addresses both design and test needs, allowing both efforts to work together to reduce product cost while improving product quality. In this article, we focus on the needs of test throughout a product´s life cycle and explain how VHDL serves those needs.
  • Keywords
    Automatic control; Automatic test equipment; Automatic testing; Computational modeling; Costs; Hardware design languages; Life testing; Packaging; Production; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1986.294903
  • Filename
    4069761