Record number
4186
Title
Oxide Reliability a Summary of Silicon Oxide Wearout, Breakdown, and Reliability
Publication
USA World Scientific
Published Year
2002
Fierst Pages
0
Main Pages
270
Collation
270
Notes
621.39732^cO96
Reprint
False
Contents
0
Print issue
0
Subject
Metal Oxide Semiconductors- Reliability+Silicon Oxide Deterioration
Class
621.39732
CutterNumber
O96
Language
انگليسي
Link To Document