• Record number
    6249
  • Author

    Parag K. Lala

  • Creator Role
    نويسنده
  • Title

    Digital Circuit Testing and Testability

  • Publication
    San Diego Academic Press
  • Published Year
    1997
  • Fierst Pages
    0
  • Main Pages
    199
  • Collation
    199
  • Notes
    621.3950287^cL3 , Glossary
  • Reprint
    False
  • Contents
    0
  • Print issue
    0
  • Subject

    Integrated Circuits- Very Large Scale Integration+Faults in Digital Circuits+Test Generation for Combinational logic Circuits+Testable Combinational Logic Circuit Design+Test Generation for Sequential Circuits

  • Class
    621.3950287
  • CutterNumber
    L3
  • Language
    انگليسي
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=7&DC=6249