A new SPICE-compatible circuit model for a single-electron box and its application to the bit error rate and maximum operating frequency of logic gates

A new SPICE-compatible circuit model for a single-electron box and its application to the bit error rate and maximum operating frequency of logic gates

This paper introduces for the first time a time-dependent SPICE-compatible circuit model for a single-electron box that is not restricted to low temperatures. The model has been verified at low frequencies against SIMON software and previous results, demonstrating excellent agreement. Moreover, the model has been used in high-frequency simulations to calculate the bit error rates of digital gates based on single-electron devices.