Title of article :
Patent applications as source for measuring technological performance
Author/Authors :
Juan Sep?lveda، نويسنده , , Adriana Paternina، نويسنده , , Andrés Suarez-Gonzalez، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
11
From page :
1385
To page :
1395
Abstract :
S-curves analysis allows to study evolution and trends in specific technological fields; its theoretical background establishes that in order to achieve the best results the analysis must be done using an independent variable that shows the effort invested in R&D activities and a dependent variable that shows the cumulative performance in that field. Actually, S-curves are built using time as independent variable because of the constraints associated in the search of investment data. This paper examines the use of patent data applications as a sample of effort; using geothermal field as a case study, it was possible to test the relationship of Patent applications and investment (R-squared, 0.86), in first place, and the construction of S-curves using patent applications count against performance (R-Squared, 0.947). Results show a high correspondence value and potential of using patent counts to direct technological performance studies.
Journal title :
Scientometrics
Serial Year :
2014
Journal title :
Scientometrics
Record number :
1016736
Link To Document :
بازگشت