Title of article :
Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope
Author/Authors :
M Kemerink، نويسنده , , P Offermans، نويسنده , , P.M. Koenraad، نويسنده , , J.K.J van Duren، نويسنده , , R.A.J Janssen، نويسنده , , H.W.M. Salemink، نويسنده , , J.H. Wolter، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2002
Pages :
4
From page :
1247
To page :
1250
Abstract :
For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injection and bulk transport in detail. It is found that tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode.
Keywords :
Scanning-tunneling microscopy , Organic semiconductor , Poly-phenylene-vinylene
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Serial Year :
2002
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Record number :
1050526
Link To Document :
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