• Title of article

    A new analytical method for stress intensity factors based on in situ measurement of crack deformation under biaxial tension

  • Author/Authors

    J.G. Wang، نويسنده , , D.Y. Ju، نويسنده , , M.J. Sun، نويسنده , , S.L. Li، نويسنده ,

  • Issue Information
    ماهنامه با شماره پیاپی سال 2011
  • Pages
    7
  • From page
    664
  • To page
    670
  • Abstract
    A new approach for the calculation of stress intensity factors (SIF) for isotropic and orthotropic materials under biaxial tension loading was proposed in this paper. In order to determine SIF from the full-field displacement data, an asymptotic expansion of the crack tip displacement field was performed. The deforming shape and surface residual stress of the crack tip was obtained at the early extended stage of the loading process by using optical microscope and X-ray diffraction measurement. During this stage, a modified Dugdale Model, which takes into account the coupled effect at the crack tip, was proposed for the open displacement of the crack tip. In this paper, the SIFs of two types of silicon steel sheet with isotropic and orthotropic properties were calculated using the modified Dugdale Model based on the biaxial tension experimental data. From the results, it was found that analysis using the modified Dugdale Model is an effective way to evaluate SIF under biaxial stress.
  • Keywords
    Biaxial tension , Insitu observation , Stress intensity factor
  • Journal title
    Materials and Design
  • Serial Year
    2011
  • Journal title
    Materials and Design
  • Record number

    1069496