Author/Authors :
S. Chakravarty ، نويسنده , , M. Gupta، نويسنده , , A. Gupta، نويسنده , , S. Rajagopalan، نويسنده , , A.K. Balamurugan d، نويسنده , , AK Tyagi، نويسنده , , U.P. Deshpande، نويسنده , , M. Horisberger، نويسنده , , T. Gutberlet، نويسنده ,
Abstract :
Simultaneous self-diffusion measurements of Fe and N in amorphous image alloy using secondary ion mass spectroscopy (SIMS) are reported. In addition, neutron reflectivity (NR) was used to study the Fe self-diffusion in the same compound. The broadening of a tracer layer of image sandwiched between image layers was observed by SIMS measurements after the annealing of films at different temperatures. A decay of the Bragg peak intensity after isothermal annealing was also observed in image multilayers in NR. It was observed by SIMS measurements that Fe diffusion was about 2 orders of magnitude smaller than N, even though the structural relaxation times for Fe and N were almost identical. This is an important result, indicating that the relaxation time of diffusion is basically driven by the relaxation of the structure itself.
Keywords :
Self-diffusion , Mass spectroscopy , Neutron reflectivity , Amorphous FeN