Title of article :
Microstructure evolution during dewetting in thin Au films Original Research Article
Author/Authors :
Claudia Manuela Müller، نويسنده , , Ralph Spolenak، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2010
Pages :
11
From page :
6035
To page :
6045
Abstract :
Thin metal films can degrade into particles in a process known as dewetting. Dewetting proceeds in several stages, including void initiation, void growth and void coalescence. Branched void growth in thin Au films was studied by means of electron backscatter diffraction (EBSD). The holes were found to protrude into the film predominantly at high angle grain boundaries and the branched shape of the holes can be explained by surface energy minimization of the grains at the void boundaries. (1 1 1) Texture sharpening during dewetting was observed and quantified by EBSD and in situ X-ray studies.
Keywords :
Texture , Annealing , Electron backscatter diffraction , Wetting , Thin films
Journal title :
ACTA Materialia
Serial Year :
2010
Journal title :
ACTA Materialia
Record number :
1145185
Link To Document :
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