Title of article :
Quantifying microstructures in isotropic grain growth from phase field modeling: Topological properties Original Research Article
Author/Authors :
Tao Xu ، نويسنده , , Sanket Sarkar، نويسنده , , Shi-Mo Li، نويسنده , , Yunzhi Wang، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2013
Pages :
10
From page :
2450
To page :
2459
Abstract :
In a previous work [Acta Materialia 2012;60:4787], we developed a new method that utilizes discrete, voxel-based data for microstructure quantification. We successfully calculated some relatively simple microstructural quantities and relations. In this paper, we apply and extend this method to compute more complex microstructural quantities and, in particular, map out the connection between grain growth rate and various topological properties. We present detailed results for several local and average topological and geometric properties of the microstructures during grain coarsening, including the curvature of grain boundaries and triple junction lines, grain cell shape, and their relations with growth dynamics. We also examine several well-known topological relations, i.e. Euler relations, the Lewis rule and the Aboav–Weaire law. These quantities and relations are the centerpiece of the grain growth models and theories developed so far. We also compare our results with some existing results in three dimensions. The quantitative description of the dynamic behaviors of the microstructural attributes adds a valuable data set to grain growth that can be used for benchmarking for phase field modeling and comparison with other approaches.
Keywords :
Microstructure , Quantitative characterization , Phase field modeling , Polycrystal , Grain growth
Journal title :
ACTA Materialia
Serial Year :
2013
Journal title :
ACTA Materialia
Record number :
1146899
Link To Document :
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