Title of article :
Structural and PL properties of Cu-doped ZnO films
Author/Authors :
Xingping Peng، نويسنده , , Jinzhang Xu، نويسنده , , Hang Zang، نويسنده , , Boyu Wang، نويسنده , , Zhiguang Wang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
4
From page :
297
To page :
300
Abstract :
Cu-doped ZnO films with hexagonal wurtzite structure were deposited on silicon (1 1 1) substrates by radio frequency (RF) sputtering technique. An ultraviolet (UV) peak at ∼380 nm and a blue band centered at ∼430 nm were observed in the room temperature photoluminescent (PL) spectra. The UV emission peak was from the exciton transition. The blue emission band was assigned to the Zn interstitial (Zni) and Zn vacancy (VZn) level transition. A strong blue peak (∼435 nm) was observed in the PL spectra when the αCu (the area ratio of Cu-chips to the Zn target) was 1.5% at 100 W, and ZnO films had c-axis preferred orientation and smaller lattice mismatch. The influence of αCu and the sputtering power on the blue band was investigated.
Keywords :
ZnO films , Cu-doped , XRD , Photoluminescence , RF sputtering
Journal title :
Journal of Luminescence
Serial Year :
2008
Journal title :
Journal of Luminescence
Record number :
1263367
Link To Document :
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