Title of article :
Methods for designing low-leakage ESD power supply clamps ☆
Author/Authors :
Timothy J. Maloney، نويسنده , , Steven S. Poon، نويسنده , , Lawrence T. Clark، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
Low-power semiconductor components require minimizing leakage currents including those from ESD protection circuits. Here, MOSFET ESD power clamps with substantial leakage reduction over previous approaches are presented. Designs are described for core logic circuits and for I/O applications where supply voltages exceed what single gate oxides can reliably sustain.
Keywords :
ICdesignforreliability , Electrostaticdischarge , Powerclamp , ESDprotection , Lowleakage , MOSFET , Backgatebias , PMOS , RCtrigger
Journal title :
JOURNAL OF ELECTROSTATICS
Journal title :
JOURNAL OF ELECTROSTATICS