Title of article :
Methods for designing low-leakage ESD power supply clamps ☆
Author/Authors :
Timothy J. Maloney، نويسنده , , Steven S. Poon، نويسنده , , Lawrence T. Clark، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
13
From page :
85
To page :
97
Abstract :
Low-power semiconductor components require minimizing leakage currents including those from ESD protection circuits. Here, MOSFET ESD power clamps with substantial leakage reduction over previous approaches are presented. Designs are described for core logic circuits and for I/O applications where supply voltages exceed what single gate oxides can reliably sustain.
Keywords :
ICdesignforreliability , Electrostaticdischarge , Powerclamp , ESDprotection , Lowleakage , MOSFET , Backgatebias , PMOS , RCtrigger
Journal title :
JOURNAL OF ELECTROSTATICS
Serial Year :
2004
Journal title :
JOURNAL OF ELECTROSTATICS
Record number :
1264598
Link To Document :
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