Title of article :
Self-recovery function of Sc–O/W(1 0 0) system as Schottky emitter
Author/Authors :
Iida، نويسنده , , S. and Tsujita، نويسنده , , T. and Nagatomi، نويسنده , , T. and Takai، نويسنده , , Y.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2003
Pages :
4
From page :
1
To page :
4
Abstract :
The damage induced by Ar+ ion irradiation onto the surface of an Sc–O/W(1 0 0) system as a Schottky emitter was investigated at room and high temperatures by means of low-energy electron diffraction and Auger electron spectroscopy. The properties of the Sc–O/W(1 0 0) surface were maintained only at ∼1500 K, the operating temperature of the Sc–O/W(1 0 0) emitter, confirming that the Sc–O/W(1 0 0) surface has a self-recovery function against surface damage induced by residual gas ion sputtering. The self-recovery function is caused by the surface segregation of Sc and O atoms from the bulk. The stable electron emission of the Sc–O/W(1 0 0) Schottky emitter is attributed not only to the stability of the properties of the Sc–O/W(1 0 0) surface at the high temperature but also to the self-recovery function.
Keywords :
Auger electron spectroscopy , Low energy electron diffraction (LEED) , surface segregation , scandium , Tungsten , Oxygen
Journal title :
Surface Science
Serial Year :
2003
Journal title :
Surface Science
Record number :
1683813
Link To Document :
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