Author/Authors :
Williams، نويسنده , , Jesse R. and Kobata، نويسنده , , Masaaki and Pis، نويسنده , , Igor and Ikenaga، نويسنده , , Eiji and Sugiyama، نويسنده , , Takeharu and Kobayashi، نويسنده , , Keisuke and Ohashi، نويسنده , , Naoki، نويسنده ,
Abstract :
The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (000 1 ¯ ) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (000 1 ¯ ) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination.
Keywords :
Polarity , Zinc oxide , Photoelectron diffraction , Wurtzite-type crystal
