Title of article :
Grazing incidence X-ray studies of ultra-thin Lumogen films
Author/Authors :
Keough، نويسنده , , S.J. and Hanley، نويسنده , , T.L. and Wedding، نويسنده , , A.B. and Quinton، نويسنده , , J.S.، نويسنده ,
Issue Information :
هفته نامه با شماره پیاپی سال 2007
Abstract :
Lumogen® Yellow S0790 films have been produced on silicon wafer substrates via physical vapour deposition (PVD) and spin-coating (SC) methods. These coatings were characterised with X-ray reflectometry (XRR) and grazing incidence X-ray diffraction (GIXD) techniques. The results show that ultra-thin (less than 12 nm) PVD films coat amorphously, with crystallinity becoming increasingly apparent with increasing film thickness. In contrast, measurements of ultra-thin (less than ∼2 nm) spin-coated films reveal a second, apparently stable crystalline structure.
Keywords :
Grazing X-rays , Lumogen , PVD , UV imaging , Thin films
Journal title :
Surface Science
Journal title :
Surface Science