Abstract :
The X-ray diffraction patterns and pole figures of the La0.67Sr0.33MnO3−δ films, which were fabricated on (110) LaAlO3 single-crystal substrates using the direct current magnetron sputtering technique were studied systematically. It is concluded that all films are high-quality epitaxial films and there is a perfect matching relationship between the films and the substrates. The effect of the different orientations ((110) and (100)) on the resistivity and metal–insulator transition temperature is briefly discussed.
