Title of article :
Mass-spectrometric and kinetic study of Ni films MOCVD from bis-(ethylcyclopentadienyl) nickel
Author/Authors :
Protopopova، نويسنده , , V.S. and Alexandrov، نويسنده , , S.E.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
6
From page :
316
To page :
321
Abstract :
The physicochemical regularities of chemical vapor deposition (CVD) of nickel films from bis-(ethylcyclopentadienyl) nickel [(EtCp)2Ni] have been experimentally studied for two reaction systems: (EtCp)2Ni–H2–Ar and (EtCp)2Ni–Ar. A model reaction scheme of (EtCp)2Ni transformations has been developed in accordance with the data from the time-of-flight mass-spectrometry of the reaction gas phase. The results from a study of process kinetics and morphology of the deposited layers show that the growth process is controlled by nucleation step in the deposition temperature range 760–840 K in case of (EtCp)2Ni pyrolysis and within the interval 640–810 K when hydrogen is added (at P[(EtCp)2Ni] = 75 Pa). The values of activation energy of the processes are 189 ± 9 and 115 ± 6 kJ·mol− 1 for the temperature ranges mentioned, respectively.
Keywords :
chemical vapor deposition , mass-spectrometry , Nickel films , morphology , Process kinetics , Bis-(ethylcyclopentadienyl) nickel
Journal title :
Surface and Coatings Technology
Serial Year :
2013
Journal title :
Surface and Coatings Technology
Record number :
1828531
Link To Document :
بازگشت