About systematic studying of chemical shifts in X-ray emission lines with the use of synchrotron radiation

A physical basis is given for the advisability to study chemical shifts in X-ray emission lines with the use of synchrotron radiation. X-ray emission lines investigation is a comparatively old method but its former application was essentially restricted by the low intensities of traditional X-ray sources. This results in a low resolution. The application of SR to excite X-ray fluorescence makes it possible to hope for a drastic increase in the accuracy of measurements of line positions, considerably higher resolution, lower background, decrease in the probe mass, and shortening of measurement time. A systematic investigation of chemical combinations will be possible from Ca (Z = 20) practically to the end of the periodic table. The method of identification of a chemical combination can be worked out using the sum of a total of 8–10 emission line shifts. Some theoretical aspects of emission line chemical shifts are presented. The factors determining the chemical shift value are the following: atom valence, combination spatial configuration, and ligand “size”. A series of chemical combinations is proposed for systematic experimental investigations and theoretical calculations.