Title of article :
Subpixel resolution in 3D cone-beam microtomography
Author/Authors :
Likhachov، نويسنده , , A.V and Pickalov، نويسنده , , V.V، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Abstract :
The application of synchrotron X-rays in industrial tomography is considered. The crack detection by tomography methods is in the scope of this paper. Numerical simulations of 3D cone-beam tomography problems are carried out. It is shown that small cracks can be reconstructed from the absorption measurements.
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
