Title of article :
Micrometric scale measurement of material structure moving utilizing μ-radiographic technique
Author/Authors :
Vavrik، نويسنده , , Daniel and Jakubek، نويسنده , , Jan and Holy، نويسنده , , Tomas، نويسنده ,
Abstract :
Studies concerning the functionality and integrity of the loaded materials require information about their mechanical behavior. Consequently, the displacement field of the loaded material has to be studied for this purpose. Although it is quite a common problem, new challenges arise when one is interested about displacement field of the micrometric scale. One promising solution is utilizing the μ-radiographic technique. Generally, the measurement of the displacement field requires some marks which can be followed as moving objects during loading. Radiographic studies of mechanical behavior of alloys or composite materials can benefit from their natural microstructure, which can be utilized as natural mark fields.
Keywords :
X-ray radiography , Pattern recognition , digital radiography
Journal title :
Astroparticle Physics