Title of article :
Quantitative descriptions of periodic layer formation during solid state reactions
Author/Authors :
Chen، نويسنده , , Y.C. and Zhang، نويسنده , , Y.G. and Chen، نويسنده , , C.Q.، نويسنده ,
Pages :
10
From page :
135
To page :
144
Abstract :
Periodic layer formation during solid state reactions is related to the stresses induced by the difference in interface growth rate of the two phases within the layer. When the elastic deformation of the slow-growing phase reaches its elastic maximum, it would be split up from the reaction front and the layer separating occurs. Theoretical model describes systematically the patterns formed in various systems and explains almost all of the experimental facts. It also predicts that the reactive diffusion system Zn/Co2Si should be interface controlled and system Zn/Fe3Si be mixed-controlled.
Keywords :
pattern formation , Periodic layer formation , Diffusion-induced stresses , Theory and modeling , Interface control
Journal title :
Astroparticle Physics
Record number :
2062754
Link To Document :
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