Title of article :
Structural analysis of arc deposited diamond-like carbon films by Raman and X-ray photoelectron spectroscopy
Author/Authors :
Li، نويسنده , , Liuhe and Zhang، نويسنده , , Haiquan and Zhang، نويسنده , , Yanhua and Chu، نويسنده , , Paul K. and Tian، نويسنده , , Xiubo and Xia، نويسنده , , Lifang and Ma، نويسنده , , Xinxin، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
7
From page :
95
To page :
101
Abstract :
Diamond-like carbon (DLC) films were deposited using metal arc under different experimental conditions. The ultra microhardness and load–displacement curves show that the typical hardness values of the deposited films range from 10 to 100 GPa. The detailed relationship between the sp3 structure and the D peak observed in the Raman spectra is investigated. For further studies, the C1s binding energy was determined employing X-ray photoelectron spectroscopy. Our results disclose that DLC films with very different sp3 structures may exhibit similar D Raman peaks.
Keywords :
X-ray photoelectron spectroscopy , Hardness , Diamond-like carbon films , Raman spectroscopy
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2002
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2138602
Link To Document :
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