Author/Authors :
Fernلndez-Lima، نويسنده , , F.A. and Gonzلlez-Alfaro، نويسنده , , Y. and Larramendi، نويسنده , , E.M. and Fonseca Filho، نويسنده , , H.D. and Maia da Costa، نويسنده , , M.E.H. and Freire Jr.، نويسنده , , F.L. and Prioli، نويسنده , , R. and de Avillez، نويسنده , , R.R. and da Silveira، نويسنده , , E.F. and Calzadilla، نويسنده , , O. and de Melo، نويسنده , , O. and Pedrero، نويسنده , , E. and Hernل، نويسنده ,
Abstract :
Polycrystalline thin films of lead sulfide (PbS) grown using substrate colloidal coating chemical bath depositions were characterized by RBS, XPS, AFM and GIXRD techniques. The films were grown on glass substrates previously coated with PbS colloidal particles in a polyvinyl alcohol solution. The PbS films obtained with the inclusion of the polymer showed non-oxygen-containing organic contamination. All samples maintained the Pb:S 1:1 stoichiometry throughout the film. The amount of effective nucleation centers and the mean grain size have being controlled by the substrate colloidal coating. The analysis of the polycrystalline PbS films showed that a preferable (1 0 0) lattice plane orientation parallel to the substrate surface can be obtained using a substrate colloidal coating chemical bath deposition, and the orientation increases when a layer of colloid is initially dried on the substrate.
Keywords :
diffraction , Ion Beam , surface morphology , Thin films , sulfides , Semiconductors
