• Title of article

    New tomographic atom probe at University of Muenster, Germany

  • Author/Authors

    Stender، نويسنده , , P. and Oberdorfer، نويسنده , , C. and Artmeier، نويسنده , , M. and Pelka، نويسنده , , P. and Spaleck، نويسنده , , F. and Schmitz، نويسنده , , G.، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2007
  • Pages
    8
  • From page
    726
  • To page
    733
  • Abstract
    Currently atom probe tomography provides the highest spatial resolution compared to all other volume analysis techniques. Owing to its single atom sensitivity, it is specially suited to study nano-structured materials. Therefore, a new atom probe was installed at the Institute for Material Physics at University of Muenster, Germany, to study thin film reactions. Since the available budget was rather limited, a cost-effective non-commercial atom probe was constructed. strument is based on a 2D delay line detector system of 120 mm diameter. To achieve a large collecting angle and thus large volumes of analysis, a straight flight tube without a reflectron is used. This way, the flight distance may be reduced down to 160 mm. However, the variable chamber layout allows using a reflectron as an alternative. Furthermore, a laser system is implemented that delivers pulses in the 500 ps range to make possible laser-assisted evaporation of atoms. The article describes instrumental details and presents first characteristic data.
  • Keywords
    Wide-angle geometry , Tomographic atom probe , Instrumental design , Laser-assisted field evaporation
  • Journal title
    Ultramicroscopy
  • Serial Year
    2007
  • Journal title
    Ultramicroscopy
  • Record number

    2156951