Title of article :
Selected-area diffraction and spectroscopy in LEEM and PEEM
Author/Authors :
Tromp، نويسنده , , R.M.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2012
Abstract :
This paper addresses the effects of spherical and chromatic aberration of the objective lens, as well as chromatic dispersion of magnetic prism arrays, on the ability to perform selected area Low Energy Electron Diffraction, as well as (Angle Resolved) Photo Electron Spectroscopy experiments in todayʹs advanced cathode lens microscopy instruments.
Keywords :
Selected area diffraction , LEEM , Selected area spectroscopy , PEEM , dispersion , Spherical aberration , Chromatic aberration
Journal title :
Ultramicroscopy
Journal title :
Ultramicroscopy