Title of article :
Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light
Author/Authors :
K. and Kilmametov، نويسنده , , A.R. and Vaughan، نويسنده , , G. and Yavari، نويسنده , , A.R. and LeMoulec، نويسنده , , A. and Botta، نويسنده , , W.J. and Valiev، نويسنده , , R.Z.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Abstract :
Microstructure evolution in severely deformed Cu has been investigated using high-energy synchrotron light during in situ high-pressure torsion (HPT) at room temperature. Relative changes in broadening of Bragg peaks and crystal lattice expansion were studied in the loading–unloading regime of torsion straining. Experimental results revealed fast relaxation (on the order of hundred of seconds) that occurred due to annihilation of HPT-induced crystal lattice defects, which were generated directly during deformation. The kinetics of relaxation is probably diffusion-controlled; therefore, the enhanced diffusivity can be explained by extremely high excess vacancy concentration, which is usually achieved at thermal equilibrium near the melting point.
Keywords :
Ultrafine-grained copper , Synchrotron light , X-ray diffraction , High-pressure torsion , Severe plastic deformation
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Journal title :
MATERIALS SCIENCE & ENGINEERING: A