Title of article :
Progress in fabrication of high quality tantalum film absorber for STJ radiation detector
Author/Authors :
E and Lissitski، نويسنده , , M.P. and Perez de Lara، نويسنده , , D. and Cristiano، نويسنده , , R. and Della Rocca، نويسنده , , M.L. and Maritato، نويسنده , , L. and SALVATO، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
We report the fabrication and characterization of high quality tantalum films as absorbers for STJ radiation detectors. Values of the residual resistance ratio up to 75 and bulk value of the superconducting transition temperature Tc=4.5±0.1 K have been achieved. Devices for detection with lateral aluminum superconducting tunnel junctions have been fabricated on such films. The detector response to X-ray is discussed.
Keywords :
Superconducting tunnel junction detector , Epitaxial thin film growing , Residual resistance ratio
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
