Title of article :
Semi-direct method for surface structure analysis using correlated thermal diffuse scattering
Author/Authors :
T. Abukawa، نويسنده , , S. Kono، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
33
From page :
19
To page :
51
Keywords :
Semiconductor , Electron diffraction , Silicon , Thermal diffuse scattering , Surface structure
Journal title :
Progress in Surface Science
Serial Year :
2003
Journal title :
Progress in Surface Science
Record number :
342831
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=342831
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