Title of article :
Scanning tunneling microscopy studies during semiconductor growth
Author/Authors :
Bert Voigtl، نويسنده , , er، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
7
From page :
33
To page :
39
Keywords :
thin films , Semicon , Silicon , Scanning tunneling microscopy (STM) , Molecular beam epitaxy (MBE) , germanium
Journal title :
Micron
Serial Year :
1999
Journal title :
Micron
Record number :
356762
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356762
