Title of article
Systematic Errors in the Measurement of Emissivity Caused by Directional Effects
Author/Authors
Kribus، Abraham نويسنده , , Vishnevetsky، Irna نويسنده , , Rotenberg، Eyal نويسنده , , Yakir، Dan نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-1838
From page
1839
To page
0
Abstract
Accurate knowledge of surface emissivity is essential for applications in remote sensing (remote temperature measurement), radiative transport, and modeling of environmental energy balances. Direct measurements of surface emissivity are difficult when there is considerable background radiation at the same wavelength as the emitted radiation. This occurs, for example, when objects at temperatures near room temperature are measured in a terrestrial environment by use of the infrared 8 -14- (mu)m band. This problem is usually treated by assumption of a perfectly diffuse surface or of diffuse background radiation. However, real surfaces and actual background radiation are not diffuse; therefore there will be a systematic measurement error. It is demonstrated that, in some cases, the deviations from a diffuse behavior lead to large errors in the measured emissivity. Past measurements made with simplifying assumptions should therefore be reevaluated and corrected. Recommendations are presented for improving experimental procedures in emissivity measurement.
Keywords
Estimation , harmonizable functions , Bias , aliasing , Doppler , Consistency , covariance , multipath , Spectral density function , cyclostationary
Journal title
Applied Optics
Serial Year
2003
Journal title
Applied Optics
Record number
75876
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