Graphic method for numerical analysis of a periodically stratified thin-film omnidirectional reflector

We introduce a graphic method for analyzing a periodically stratified multilayer omnidirectional reflector. When the dispersive refractive indices of the materials are known, the contours of constant omnibandwidth and constant center wavelength with respect to layer thickness can be numerically and graphically presented for analysis. Examples of this procedure for TiO2/SiO2 and Si/SiO2 periodically layered systems for the visible and near-infrared regions are given. A comparison of omnidirectional reflectors of quarter-wave and non-quarter-wave layer thicknesses is made by the graphic method