Title of article
Diffraction and Line Shape of Fourier-Transform Spectrometers
Author/Authors
Tremblay، Pierre نويسنده , , Genest، Jerome نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-4540
From page
4541
To page
0
Abstract
The effect of diffraction on the instrument line shape of a Fourier-transform spectrometer is studied with an analytical line-shape model. The expression for the instrument line shape of a diffracted point source is obtained. A simple condition on the throughput of the instrument is derived under which diffraction is negligible when compared with the field-of-view-induced line shape. The effect of diffraction is illustrated and compared for various instruments.
Keywords
Bias , Doppler , Consistency , cyclostationary , aliasing , covariance , Spectral density function , multipath , Estimation , harmonizable functions
Journal title
Applied Optics
Serial Year
2003
Journal title
Applied Optics
Record number
76368
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