• Title of article

    Measurement of Profiles along a Circle on Two Flat Surfaces by Use of a Fizeau Interferometer with No Standard

  • Author/Authors

    Iwata، Koichi نويسنده , , Sonozaki، Shohachi نويسنده , , Iwahashi، Yoshihisa نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -6852
  • From page
    6853
  • To page
    0
  • Abstract
    A method for measuring profiles along a circle on a flat surface with no standard is described. For the measurement, two unknown surfaces are placed almost parallel, and the distance between them is measured many times along a circle by rotation of one of the surfaces. Profiles of the two surfaces can be determined from the distance data. In this study the measuring method is explained: The space between two surfaces measured with a Fizeau interferometer. Four measuring experiments are carried out for determining the profile of a precision-grade half-mirror; in each experiment a different ordinary mirror with unknown profile is used as the second mirror. Profiles of the precise mirrors obtained by these experiments agree closely, with deviations of ~2 nm. A similar experiment with many concentric circles was carried out with a precise half-mirror and another precise mirror. Although the profiles of many concentric circles were independent of one another, the result shows that the high-frequency component of a whole plane can be estimated.
  • Keywords
    instrumentation , Measurement , Surface measurements , figure , Interferometry , Metrology
  • Journal title
    Applied Optics
  • Serial Year
    2003
  • Journal title
    Applied Optics
  • Record number

    76569